首页> 外国专利> METHOD FOR COMPENSATING CHROMATIC ABERRATION, AND METHOD AND APPARATUS FOR MEASURING THREE DIMENSIONAL SHAPE BY USING THE SAME

METHOD FOR COMPENSATING CHROMATIC ABERRATION, AND METHOD AND APPARATUS FOR MEASURING THREE DIMENSIONAL SHAPE BY USING THE SAME

机译:补偿色差的方法,使用相同方法测量三维形状的方法和装置

摘要

chromatic aberration compensation method, three-dimensional shape measurement methods and measuring apparatus using the same are disclosed. The chromatic aberration compensation method comprising the steps of: obtaining a reference phase shift amount of the reference phase shift amount of the red light, the reference phase shift amount of the green light and the blue light, the red light of the mean intensity, the average intensity and phase, and the red light to obtain the average intensity of the blue light of the green light reference phase changing amount, the green light and the average intensity change of the reference phase of the reference phase change amount of the blue light and the red light, the intensity and the average intensity by using the average of the blue light of the green light comprises the step of obtaining the face offset. Therefore, it is possible to more accurately measure the three-dimensional shape to correct chromatic aberration of the measurement object and coming from the different colors formed on the substrate and the substrate. ;
机译:公开了色差补偿方法,三维形状测量方法以及使用该方法的测量设备。色差补偿方法包括以下步骤:获得红光的参考相移量的参考相移量,绿光和蓝光的参考相移量,平均强度的红光,平均强度和相位,以及红光获得蓝光的平均强度,绿光参考相的变化量,绿光和参考光的平均强度变化,蓝光的参考相的变化量和通过使用绿光的蓝光的平均值,红光,强度和平均强度包括获得面部偏移的步骤。因此,可以更准确地测量三维形状,以校正测量对象的色差,该色差来自形成在基板和基板上的不同颜色。 ;

著录项

  • 公开/公告号KR101329025B1

    专利类型

  • 公开/公告日2013-11-14

    原文格式PDF

  • 申请/专利权人

    申请/专利号KR20100112762

  • 申请日2010-11-12

  • 分类号G01B11/25;G06T15/00;

  • 国家 KR

  • 入库时间 2022-08-21 15:44:23

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