首页> 外国专利> PERFORMANCE IMPROVING DEVICE OF MICRO DUST MEASURING INSTRUMENT BY USING MODEL RETURING ANALYZING METHOD

PERFORMANCE IMPROVING DEVICE OF MICRO DUST MEASURING INSTRUMENT BY USING MODEL RETURING ANALYZING METHOD

机译:应用模型回归分析法改善微尘计量器具的性能

摘要

The present invention relates to a performance improving device of micro dust measuring instrument by using a model returning analyzing method which uses measuring data of a high priced, high accurate micro dust measuring instrument as standard data, and corrects measuring data from relatively low priced micro dust measuring instrument by using a model returning analyzing function which is equipped in a central processing unit thereby enabling to replace as low priced micro dust measuring instrument having a comparable performance with the high priced, high accurate micro dust measuring instrument. The present invention comprises: a central processing unit which is equipped with a model returning analyzing function; a measurement unit which measures micro dust measuring instrument; a memory unit which stores the measured data; a display unit which indicates the measured data; a communication unit which enables radio, wire communication of the measured data; a control unit which controls system; a status unit which shows the status of the system and error generation. The measured data is flowed in through the measurement unit, stored in the memory unit for storing the measured data, corrected though the model returning analyzing function which is equipped in a central processing unit and stored again in the memory unit. The corrected data is indicated through the display unit, and the control units controlling the system controls whether the corrected data is to be transmitted or received with the radio, wire communication; the status unit indicates the normal operation of the system or the error generation.;COPYRIGHT KIPO 2014;[Reference numerals] (10) Control unit; (11) Memory unit; (12) Communication unit; (13) Display unit; (14) Status unit; (7) Power supply unit (battery included); (8) Central Processing Unit; (9) Measurement unit
机译:本发明涉及一种微粉尘测量仪的性能改进装置,其使用模型返回分析方法,该方法将高价,高精度的微粉尘测量仪的测量数据作为标准数据,并从相对低价的微粉尘校正测量数据。通过使用配备在中央处理单元中的模型返回分析功能,该测量仪器可以代替具有与高价,高精度的微尘测量仪器相当性能的低价微尘测量仪器。本发明包括:中央处理单元,其具有模型返回分析功能;以及测量微粉尘测量仪的测量单元;存储该测量数据的存储单元;显示单元,指示测量数据;通信单元,使得能够无线,有线方式传输测量数据;控制系统的控制单元;状态单元,显示系统状态和错误生成。测量数据流经测量单元,存储在用于存储测量数据的存储单元中,通过配备在中央处理单元中并再次存储在存储单元中的模型返回分析功能进行校正。校正后的数据通过显示单元指示,控制系统的控制单元控制是否要通过无线电,有线通信发送或接收校正后的数据。 COPYRIGHT KIPO 2014; [附图标记](10)控制单元;状态单元指示系统的正常运行或错误产生。 (11)内存单元; (十二)通信单位; (13)显示单元; (十四)状态单位; (7)电源装置(包括电池); (八)中央处理器; (9)计量单位

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号