首页> 外国专利> A METHOD OF CALCULATING A REMAINING CITED-PATENT LIFE TIME, AN APPARATUS FOR CALCULATING A REMAINING CITED-PATENT LIFE TIME, AND STORAGE MEDIUM FOR STORING A PROGRAM CALCULATING A REMAINING CITED-PATENT LIFE TIME

A METHOD OF CALCULATING A REMAINING CITED-PATENT LIFE TIME, AN APPARATUS FOR CALCULATING A REMAINING CITED-PATENT LIFE TIME, AND STORAGE MEDIUM FOR STORING A PROGRAM CALCULATING A REMAINING CITED-PATENT LIFE TIME

机译:计算剩余专利有效期的方法,计算剩余专利有效期的装置和用于存储程序的存储介质以计算剩余专利有效期的时间

摘要

The present invention relates to a method and an apparatus for calculating a remaining cited-patent life time, and a storage medium for storing a program calculating the cited-patent life time. Provided in an embodiment of the present invention is a method for calculating a remaining cited patent life time including the steps of: calculating the number of cited times of patents included in a first technology group cited according to the number of lapse years of the patents from information on the patents of the first technology group; calculating a survival probability by the number of lapse years of the patents using the calculated number of cited times of the patents included in the first technology group; calculating an average cited patent life time including obsolescence periods of the patents included in the first technology group using the calculated survival probability by the number of lapse years; and calculating a value obtained by subtracting the number of lapse years of a first patent among the patents included in the first technology group from the calculated average cited patent life time as a remaining expectation life time of the first patent. [Reference numerals] (S110) Calculate the number of cited times of patents included in a first technology group according to the number of lapse years of the patents from information on the patents of the first technology group; (S120) Calculate a survival probability by the number of lapse years of the patents included in the first technology group using the calculated number of cited times of the patents; (S130) Calculate an average cited patent life time including obsolescence periods of the patents included in the first technology group using the calculated survival probability by the number of lapse years; (S140) Calculate a value obtained by subtracting the number of lapse years of a first patent among the patents included in the first technology group from the calculated average cited patent life time as a remaining expectation life time of the first patent
机译:本发明涉及一种用于计算剩余的被引用专利寿命的方法和设备,以及一种用于存储计算被引用专利寿命的程序的存储介质。本发明实施例提供了一种计算剩余被引用专利寿命的方法,该方法包括以下步骤:根据所述专利的失效年限,计算被引用的第一技术组中所包括的专利的被引用次数。有关第一技术集团专利的信息;使用计算出的第一技术组中包括的专利的引用次数,通过专利的失效年数来计算生存概率;使用所计算出的生存概率和失效年数来计算包括在第一技术组中的专利的失效期在内的平均被引用专利寿命,包括该专利的过时期限;然后,从计算出的平均引用专利寿命中减去第一技术组所包含的专利中第一专利的失效年数,作为第一专利的剩余期望寿命。 [参考数字](S110)根据关于第一技术组的专利的信息的专利的失效年数,计算第一技术组中包括的专利的引用次数; (S120)使用计算出的专利引用次数,通过第一技术组中所包括的专利的失效年数来计算生存概率; (S130)使用所计算出的生存概率和失效年数,计算包括在第一技术组中的专利的过时期间在内的平均被引用专利寿命,包括: (S140)计算通过从计算出的平均引用专利寿命中减去第一技术组中包括的专利中第一专利的失效年数而获得的值,作为第一专利的剩余期望寿命。

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