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X-ray radiation detector with enhanced spatial homogeneity of amplification and resolution and method of manufacturing a x-ray radiation detector

机译:具有增强的放大率和分辨率的空间均匀性的x射线辐射探测器以及制造x射线辐射探测器的方法

摘要

1. An X-ray detector (1) comprising: a light detection device (3) for detecting light (R) incident on its detection surface (12); a scintillation layer (5) for converting incident X-rays (X) into light; reflective a layer (9) for reflecting light (B) generated within the scintillation layer towards the light detection device; a light emitting layer (7) enclosed between the scintillation layer and the reflective layer, the distance (d) between the scintillation layer and the reflective layer being less more than 50 μm, and in this case, the light-emitting layer contains acid (8) .2. The X-ray detector according to claim 1, wherein the OLED is provided with an OLED foil (8 ') with radiation from above. The X-ray detector according to claim 2, wherein the OLED foil (8 ') with radiation from above is attached by the surface of its upper side to the scintillator. An X-ray detector according to claim 2 or 3, wherein the OLED foil (8 ') with radiation from above comprises a mechanically stabilizing non-metallic substrate (45) and a metal layer (43) deposited on the substrate. The X-ray detector according to claim 1, wherein the OLED is provided with an OLED foil (8 ”) with radiation from below. The X-ray detector according to claim 5, in an OLED foil (8 ”) with radiation from below is attached by the surface of its lower side to the scintillator and contains a support layer (61) having a thickness of less than 50 μm. An X-ray detector according to one of claims 1 to 6, in which the light-emitting layer is divided into subcells (15) .8. An X-ray detector according to one of claims 1 to 7, in which the light-emitting layer contains metal shunt buses (23) .9. Detection manufacturing method
机译:1.一种X射线检测器(1),包括:光检测装置(3),用于检测入射在其检测表面(12)上的光(R);以及闪烁层(5),用于将入射的X射线(X)转换成光;将用于将闪烁层内产生的光(B)反射向光检测装置的层(9);闪烁层和反射层之间的发光层(7),闪烁层和反射层之间的距离(d)小于50μm,在这种情况下,发光层包含酸( 8).2。 2.根据权利要求1所述的X射线检测器,其特征在于,所述有机发光二极管具备从上方放射的有机发光二极管箔(8')。 3.根据权利要求2所述的X射线检测器,其中,具有来自上方的辐射的所述OLED箔(8')通过其上表面附着在所述闪烁体上。 4.根据权利要求2或3所述的X射线检测器,其中,具有来自上方的辐射的所述OLED箔(8')包括机械稳定的非金属基板(45)和沉积在所述基板上的金属层(43)。 2.根据权利要求1所述的X射线检测器,其特征在于,所述有机发光二极管(OLED)设置有具有来自下方的放射线的有机发光二极管箔(8”)。 6.根据权利要求5所述的X射线检测器,在具有来自下方的放射线的OLED箔(8”)的下方侧的表面附着于所述闪烁体,并包含厚度小于50μm的支撑层(61)。 。 7.根据权利要求1至6中的一项所述的X射线检测器,其中,所述发光层被分成子单元(15).8。 8.根据权利要求1至7中的一项所述的X射线检测器,其中,所述发光层包含金属分流母线(23).9。检测制造方法

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