Centres of some strain resistance gauges included into opposite arms of the bridge measurement circuit and perceiving relative positive deformations are located at the distance from the centre of the crystal determined on the basis of the following ratio: Centres of other strain resistance gauges included into opposite arms of the bridge measurement circuit and perceiving relative negative deformations are located at the distance from the centre of the crystal determined on the basis of the following ratio: ;EFFECT: higher accuracy of measurement.;7 dwg"/>
公开/公告号RU2507490C1
专利类型
公开/公告日2014-02-20
原文格式PDF
申请/专利号RU20120144906
申请日2012-10-22
分类号G01L9/04;
国家 RU
入库时间 2022-08-21 15:38:42