The apparatus of a test specimen independent test system for the electrical function test of one or both sides of test points and method for this purpose, electrically contactable

摘要

The apparatus of a test specimen independent test system for the electrical function test of single-sidedly or double-sidedly electrically contactable test points (a), wherein the test points (a) by interconnect network endpoints or single-point networks to be tested by a bare electrical circuit substrate (a) are given, comprising a sensor (c, b), wherein the flow meter (c, b) grid points of contact (d, g), which are arranged in a uniform xy grid, wherein the grid points of contact (d, g) are electrically conductive, and wherein the grid points of contact (d, g) are electrically insulated with respect to each other, and the apparatus further comprises a measuring and control unit (f), in order to enable grid points of contact (d, g), individually or in groups by means of an active switching matrix (c), in order to activate one or more conductive connections between the apparatus to be tested electrical circuit substrate (a) and the measurement and control unit (f), wherein the sum of grid point of contact width (d) and the distance (e) to an adjacent grid point of contact (d, g) is less than the smallest distance (b) of two test points (a), and wherein the distance (e) between two adjacent grid points of contact (d, g) is smaller than the area of expansion (c) of a checkpoint (a), and wherein the grid points of contact to be controlled (d, g) on the basis of known test data of the test electrical circuit carrier (a) of the measuring and control unit (f), in order to be controlled in a targeted manner to electrical connection required, a power interruption and short-circuiting to test.