首页> 外国专利> System for monitoring and control of photoactive components,has test system that is provided with optical measuring device, monitoring and evaluation system and adjustable diaphragm

System for monitoring and control of photoactive components,has test system that is provided with optical measuring device, monitoring and evaluation system and adjustable diaphragm

机译:光敏元件的监控系统,具有配备光学测量装置的测试系统,监控和评估系统以及可调光阑

摘要

The system has a test structure (7) that is provided with an optical measuring device (1), a monitoring and evaluation system and an adjustable diaphragm. The test structure is located on the edge or between the photo-active components. The measuring device is provided with a movable or stationary spectrometer to measure the layer thickness and/or the electrical resistance of the test structure. An independent claim is included for a method for monitoring and control of photoactive components.
机译:该系统具有测试结构(7),该测试结构设有光学测量装置(1),监视和评估系统以及可调节的光圈。测试结构位于边缘或光敏组件之间。该测量装置设有可移动或固定的光谱仪,以测量测试结构的层厚度和/或电阻。包括独立权利要求,其用于监测和控制光敏组分的方法。

著录项

  • 公开/公告号DE102012104844A1

    专利类型

  • 公开/公告日2013-12-05

    原文格式PDF

  • 申请/专利权人 HELIATEK GMBH;

    申请/专利号DE201210104844

  • 发明设计人 WICHTENDAHL RALPH;

    申请日2012-06-05

  • 分类号H01L21/66;H01L31/18;H01L51/48;

  • 国家 DE

  • 入库时间 2022-08-21 15:37:50

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