Measuring head tip for spectrometer for application of e.g. laser-induced emission spectroscopy, has receiving element whose contact surface is conducted along light through head tip on sample during intended operation of head tip

摘要

The head tip (1) has a contact element (3) standing in contact with a sample (16) to be tested. A receiving element (2) receives the contact element that is mounted in the receiving element and moves along a contact surface (4) i.e. curved surface, of the receiving element. The contact surface is partially aligned perpendicular to a light propagation direction and conducted along a light through the head tip on the sample to be tested during an intended operation of the head tip. The contact surface is formed at a moving element (6) of the receiving element. Independent claims are also included for the following: (1) a measuring head for a spectrometer (2) a spectrometer.