首页> 外国专利> METHOD FOR MEASURING PEAK WAVELENGTH, METHOD FOR MEASURING ILLUMINANCE, DEVICE FOR MEASURING PEAK WAVELENGTH, PRINTER, AND PROGRAM

METHOD FOR MEASURING PEAK WAVELENGTH, METHOD FOR MEASURING ILLUMINANCE, DEVICE FOR MEASURING PEAK WAVELENGTH, PRINTER, AND PROGRAM

机译:峰值波长的测定方法,照度的测定方法,峰值波长的测定装置,打印机以及程序

摘要

PROBLEM TO BE SOLVED: To provide a simple method for measuring a peak wavelength of light.;SOLUTION: A brightness value of light emitted by a light emitting element is acquired, a predetermined relationship between a brightness value and a peak wavelength and an acquired brightness value are used, to calculate a peak wavelength of the light emitted by the light emitting element.;COPYRIGHT: (C)2015,JPO&INPIT
机译:解决的问题:提供一种测量光的峰值波长的简单方法。解决方案:获取发光元件发出的光的亮度值,亮度值与峰值波长之间的预定关系与获取的亮度值用于计算发光元件发出的光的峰值波长。;版权所有:(C)2015,JPO&INPIT

著录项

  • 公开/公告号JP2015147319A

    专利类型

  • 公开/公告日2015-08-20

    原文格式PDF

  • 申请/专利权人 SEIKO EPSON CORP;

    申请/专利号JP20140020432

  • 发明设计人 TANAKA TOSHIO;TAKANASHI KO;

    申请日2014-02-05

  • 分类号B41J2/01;

  • 国家 JP

  • 入库时间 2022-08-21 15:35:39

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