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METHOD FOR TESTING OPTIMIZED BINARY MODULE, COMPUTER FOR TESTING OPTIMIZED BINARY MODULE, AND COMPUTER PROGRAM THEREFOR
METHOD FOR TESTING OPTIMIZED BINARY MODULE, COMPUTER FOR TESTING OPTIMIZED BINARY MODULE, AND COMPUTER PROGRAM THEREFOR
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机译:测试优化的二进制模块的方法,测试优化的二进制模块的计算机及其计算机程序
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摘要
PROBLEM TO BE SOLVED: To acquire a test case from a production-run environment in such a way as not to degrade performance and make it possible to test an optimized binary module.SOLUTION: The present invention is a technique for testing an optimized binary module, the technique including: selecting, on the basis of profile information, an area in an original binary code, within an original binary module, that is likely to be branching-covered as an area to be optimized; creating an optimized binary module in which the area to be optimized is optimized; and verifying the created optimized binary module, while executing each of the optimized binary module and the original binary module, by synchronizing the execution of each of the optimized binary module and the original binary module at a checkpoint and comparing the outputs of the respective execution.
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