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METHOD FOR TESTING OPTIMIZED BINARY MODULE, COMPUTER FOR TESTING OPTIMIZED BINARY MODULE, AND COMPUTER PROGRAM THEREFOR

机译:测试优化的二进制模块的方法,测试优化的二进制模块的计算机及其计算机程序

摘要

PROBLEM TO BE SOLVED: To acquire a test case from a production-run environment in such a way as not to degrade performance and make it possible to test an optimized binary module.SOLUTION: The present invention is a technique for testing an optimized binary module, the technique including: selecting, on the basis of profile information, an area in an original binary code, within an original binary module, that is likely to be branching-covered as an area to be optimized; creating an optimized binary module in which the area to be optimized is optimized; and verifying the created optimized binary module, while executing each of the optimized binary module and the original binary module, by synchronizing the execution of each of the optimized binary module and the original binary module at a checkpoint and comparing the outputs of the respective execution.
机译:解决的问题:以不降低性能的方式从生产运行环境中获取测试用例,并使其能够测试优化的二进制模块。解决方案:本发明是一种用于测试优化的二进制模块的技术。所述技术包括:基于简档信息,在原始二进制模块内的原始二进制代码中选择可能被分支覆盖的区域作为要优化的区域;创建一个优化的二进制模块,在其中优化要优化的区域;在执行每个优化二进制模块和原始二进制模块的同时,通过在检查点同步每个优化二进制模块和原始二进制模块的执行并比较各自执行的输出,来验证创建的优化二进制模块。

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