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MAGNETIC DISK SURFACE DEFECT INSPECTION DEVICE AND MAGNETIC DISK SURFACE DEFECT INSPECTION METHOD

机译:磁盘表面缺陷检查装置及磁盘表面缺陷检查方法

摘要

PROBLEM TO BE SOLVED: To provide a magnetic disk surface detect inspection device, capable of outputting defect position coordinate information that enables a defect to be observed to easily fall within an observation visual field at a high magnification of a specific observation device.;SOLUTION: A magnetic disk surface defect inspection device includes: an inspection optical mechanism unit that includes a spindle, a stage moving this spindle in a uniaxial direction, a laser light source irradiating a magnetic disk mounted on and rotated by the spindle with a laser beam, and a detector detecting a reflected light from the magnetic disk; a signal processing unit processing an output signal from the detector to detect a defect; and a data processing unit processing data on the detected defect to extract information including positional information on the defect. The data processing unit processes the data on the defect detected by the signal processing unit, and outputs (X, Y) coordinate data obtained by correcting erroneous setting of the magnetic disk to the spindle as the positional information on the defect.;COPYRIGHT: (C)2015,JPO&INPIT
机译:解决的问题:提供一种磁盘表面检测检查装置,其能够输出缺陷位置坐标信息,该信息能够以特定的观察装置的高倍率容易地将观察到的缺陷落入观察视野内。磁盘表面缺陷检查装置包括:检查光学机构​​单元,其包括主轴;在单轴方向上移动该主轴的台;用激光束照射安装在主轴上并由其旋转的磁盘的激光光源;以及检测器,其检测来自磁盘的反射光;信号处理单元处理来自检测器的输出信号以检测缺陷;数据处理单元处理关于检测到的缺陷的数据以提取包括关于缺陷的位置信息的信息。数据处理单元处理由信号处理单元检测到的关于缺陷的数据,并且将通过校正磁盘的错误设置而获得的(X,Y)坐标数据输出到主轴上,作为关于缺陷的位置信息。 C)2015,日本特许厅

著录项

  • 公开/公告号JP2015069678A

    专利类型

  • 公开/公告日2015-04-13

    原文格式PDF

  • 申请/专利权人 HITACHI HIGH-TECH FINE SYSTEMS CORP;

    申请/专利号JP20130203518

  • 发明设计人 SUGITA TOSHIAKI;YANAKA YU;

    申请日2013-09-30

  • 分类号G11B5/84;G01N21/95;G01B11/30;

  • 国家 JP

  • 入库时间 2022-08-21 15:35:00

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