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OPTICAL FREQUENCY DOMAIN REFLECTION MEASURING METHOD, OPTICAL FREQUENCY DOMAIN REFLECTION MEASURING DEVICE, AND APPARATUS FOR MEASURING POSITION OR SHAPE USING THE SAME
OPTICAL FREQUENCY DOMAIN REFLECTION MEASURING METHOD, OPTICAL FREQUENCY DOMAIN REFLECTION MEASURING DEVICE, AND APPARATUS FOR MEASURING POSITION OR SHAPE USING THE SAME
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机译:光学频率域反射测量方法,光学频率域反射测量设备以及使用该方法测量位置或形状的装置
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摘要
PROBLEM TO BE SOLVED: To provide an optical frequency domain reflection measuring method capable of detecting a distortion change within a short time, an optical frequency domain reflection measuring device, and an apparatus for measuring a position or a shape using the same.;SOLUTION: A polarization multiplexing section 10 generates a light by multiplexing lights in first and second polarization states of polarization waves orthogonal with each other with a shorter predetermined time difference than a time for light reciprocation by a fiber Bragg diffraction grating. The generated light is given as a measuring light Pmes to an optical fiber 37 to be measured including the fiber Bragg diffraction grating of which the grating interval is chirped. In a signal processing section 101, Fourier transform processing on digital signals Ds and Dp which are obtained by one time of wavelength sweeping, is performed while being divided in a plurality of terms where beat frequencies generated by interference between reflection lights from the optical fiber 37 to be measured with respect to the lights in the first and second polarization states, and a reference light are not overlapped. Fourier transform results are combined on a distance axis, and properties of the optical fiber to be measured with respect to the lights in the first and second polarization states are calculated.;COPYRIGHT: (C)2016,JPO&INPIT
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