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NOBLE METAL AMOUNT CALCULATION APPARATUS AND NOBLE METAL AMOUNT CALCULATION METHOD

机译:贵金属量计算装置和贵金属量计算方法

摘要

PROBLEM TO BE SOLVED: To provide a noble metal amount calculation apparatus and a noble metal amount calculation method capable of calculating an amount of noble metal and copper contained in entire electronic boards recovered from used consumer products, information equipment and the like in a nondestructive way.;SOLUTION: X-ray sensor members 1 and 2 can supply X-ray fluoroscopic images each obtained by irradiating a measurement target 6 with an X-ray. An optical sensor member 3 can supply optical images of both one principal surface 60A of the measurement target 6 and the other principal surface 60B thereof. Electromagnetic sensor members 4 and 5 can supply reflection intensity distribution images each obtained by irradiating the measurement target 6 with an electromagnetic wave. A computing determination unit 7 calculates an amount of noble metal contained in the measurement target 6 on the basis of the X-ray fluoroscopic images, the optical images, and the reflection intensity distributions. The computing determination unit 7 includes a database for identifying a type of a component 61 mounted on the measurement target 6 on the basis of the X-ray fluoroscopic images and the optical images.;COPYRIGHT: (C)2015,JPO&INPIT
机译:解决的问题:提供一种能够无损地计算从使用过的消费品,信息设备等回收的整个电子基板中所含的贵金属和铜的量的贵金属量计算装置和贵金属量计算方法。解决方案:X射线传感器部件1和2可以提供X射线透视图像,每个图像都是通过用X射线照射测量目标6而获得的。光学传感器构件3可以提供测量目标6的一个主表面60A和其另一主表面60B两者的光学图像。电磁传感器构件4和5可以提供各自通过用电磁波照射测量目标6而获得的反射强度分布图像。计算确定单元7基于X射线透视图像,光学图像和反射强度分布来计算测量目标6中包含的贵金属的量。计算确定单元7包括用于基于X射线透视图像和光学图像来识别安装在测量目标6上的部件61的类型的数据库。版权所有:(C)2015,JPO&INPIT

著录项

  • 公开/公告号JP2015161579A

    专利类型

  • 公开/公告日2015-09-07

    原文格式PDF

  • 申请/专利权人 MITSUBISHI ELECTRIC CORP;

    申请/专利号JP20140036812

  • 发明设计人 UEHARA YASUSHI;

    申请日2014-02-27

  • 分类号G01N23/04;G01N21/27;

  • 国家 JP

  • 入库时间 2022-08-21 15:33:57

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