首页> 外国专利> PARTICLE TRAJECTORY DETECTION METHOD AND PARTICLE TRAJECTORY DETECTION DEVICE

PARTICLE TRAJECTORY DETECTION METHOD AND PARTICLE TRAJECTORY DETECTION DEVICE

机译:粒子轨迹检测方法及粒子轨迹检测装置

摘要

PROBLEM TO BE SOLVED: To provide a method for detecting a trajectory drawn by particles descending in a vessel and a particle velocity distribution.;SOLUTION: A plurality of particles 100 stored in a vessel 10 and having predetermined particle sizes are caused to gradually descend by gravity, and unloaded from a lower opening 12. Provided is a method for detecting a trajectory drawn by the particles 100 by transmitting a radiations in the vessel 10. The method includes: a step of adding at least one particle shielding the radiations and acting as an indicator for the particles 100 stored in the vessel 10; a step of providing a plurality of X-ray sources 20 irradiating side surfaces of the vessel 10 with radiations from different directions, respectively; a step of providing a plurality of detectors 30 opposite to the respective X-ray sources 20 across the vessel 10; and determining a trajectory of the indicator particle on the basis of signals detected by the detectors 30.;COPYRIGHT: (C)2015,JPO&INPIT
机译:解决的问题:提供一种检测由落在容器中的颗粒绘制的轨迹和颗粒速度分布的方法。解决方案:使储存在容器10中且具有预定颗粒尺寸的多个颗粒100逐渐下降重力,并从下部开口12卸载。提供了一种通过在容器10中传输辐射来检测由粒子100绘制的轨迹的方法。该方法包括:添加至少一个屏蔽辐射并充当粒子的粒子的步骤。储存在容器10中的颗粒100的指示器;提供多个X射线源20分别照射来自不同方向的辐射的容器10的侧面的步骤;跨容器10设置与各个X射线源20相对的多个检测器30的步骤;并基于检测器30检测到的信号确定指示剂颗粒的轨迹。;版权所有:(C)2015,日本特许厅&INPIT

著录项

  • 公开/公告号JP2015102332A

    专利类型

  • 公开/公告日2015-06-04

    原文格式PDF

  • 申请/专利权人 IHI CORP;

    申请/专利号JP20130240721

  • 发明设计人 FUJIWARA KOSUKE;

    申请日2013-11-21

  • 分类号G01N23/04;

  • 国家 JP

  • 入库时间 2022-08-21 15:33:31

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