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COATING FILM STRUCTURE ANALYZER AND COATING FILM STRUCTURE ANALYSIS METHOD

机译:涂层膜结构分析仪和涂层膜结构分析方法

摘要

PROBLEM TO BE SOLVED: To provide a coating film structure analyzer which examines a state of a radiant material in a coating film three-dimensionally in detail, in a depth direction as well, and a coating film structure analysis method.SOLUTION: A coating film structure analyzer 100 includes: image acquisition means 1 which images a coating film including a radiant material by use of transmissive radiation, to obtain a three-dimensional image; radiant material extraction means 2 which extracts an image part of the radiant material from the three-dimensional image; and statistical analysis means 3 which quantifies and analyzes particle size distribution, orientation distribution, depth distribution and a bending state of the radiant material in the coating film on the basis of a result extracted by the radiant material extraction means 2.
机译:解决的问题:提供一种涂膜结构分析仪,其还沿深度方向三维地详细检查涂膜中的辐射材料的状态,以及涂膜结构分析方法。结构分析器100包括:图像获取装置1,该图像获取装置1通过使用透射辐射使包括辐射材料的涂膜成像,以获得三维图像。辐射材料提取装置2从三维图像中提取辐射材料的图像部分。统计分析装置3根据由辐射材料提取装置2提取的结果,量化并分析涂膜中辐射材料的粒径分布,取向分布,深度分布和弯曲状态。

著录项

  • 公开/公告号JP2014215169A

    专利类型

  • 公开/公告日2014-11-17

    原文格式PDF

  • 申请/专利权人 TOYOTA MOTOR CORP;

    申请/专利号JP20130092575

  • 申请日2013-04-25

  • 分类号G01N23/04;A61B5/055;G01R33/48;

  • 国家 JP

  • 入库时间 2022-08-21 15:33:02

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