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TRAJECTORY ANALYSIS DEVICE, TRAJECTORY ANALYSIS METHOD, AND ZERO POINT CORRECTION METHOD

机译:弹道分析装置,弹道分析方法和零点校正方法

摘要

PROBLEM TO BE SOLVED: To correct an effect, including an error, by the presence of a phenomenon such as zero point drift in which each measurement value, for example, a voltage value drifts between a static state before measurement (acceleration zero) and a static state after measurement (acceleration zero), due to the environment around a trajectory analysis device including an acceleration sensor or an angular velocity sensor, or hysteresis of the device.;SOLUTION: A zero point drift value D that is a difference between a first zero point and a second zero point is calculated in an analysis unit 8, and an effect resulting from the zero point drift value D is corrected from position data in a moving state of a racket 50, which is measured in a position detection unit 2. Therefore, in the trajectory analysis device 30, position data can be accurately obtained while suppressing the effect (error) by zero point drift.;COPYRIGHT: (C)2015,JPO&INPIT
机译:要解决的问题:通过诸如零点漂移之类的现象来纠正包括错误在内的影响,在该现象中,每个测量值(例如,电压值)在测量前的静态状态(加速度为零)和测量后的静态(加速度为零),这是由于轨迹分析设备周围的环境(包括加速度传感器或角速度传感器)或设备的磁滞引起的;解决方案:零点漂移值D为第一点与第二点之间的差在分析单元8中计算零点和第二零点,并且从在位置检测单元2中测量的球拍50的运动状态下的位置数据校正由零点漂移值D产生的效果。因此,在轨迹分析装置30中,可以在通过零点漂移抑制效果(误差)的同时准确地获得位置数据。版权所有:(C)2015,JPO&INPIT

著录项

  • 公开/公告号JP2015062701A

    专利类型

  • 公开/公告日2015-04-09

    原文格式PDF

  • 申请/专利权人 SEIKO EPSON CORP;

    申请/专利号JP20140242883

  • 申请日2014-12-01

  • 分类号A63B69/38;A63B69/00;

  • 国家 JP

  • 入库时间 2022-08-21 15:33:02

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