首页> 外国专利> TEST PIECE FOR CALCULATING ELECTRON SCATTERING DISTANCE AND METHOD FOR CALCULATING ELECTRON SCATTERING DISTANCE

TEST PIECE FOR CALCULATING ELECTRON SCATTERING DISTANCE AND METHOD FOR CALCULATING ELECTRON SCATTERING DISTANCE

机译:计算电子散射距离的测试件和计算电子散射距离的方法

摘要

PROBLEM TO BE SOLVED: To provide a test piece for calculating an electron scattering distance, used for calculating the distribution state of backscattered electron beams that cause a fogging effect in an electron beam exposure system and is incident to a surface of a drawing subject within a chamber of the electron beam exposure system.;SOLUTION: A test piece 1 for calculating an electron scattering distance is used for calculating the distribution state of backscattered electron beams that is incident to a surface of a drawing subject within a chamber of an electron beam exposure system. The test piece 1 for calculating an electron scattering distance is obtained by forming a light shielding layer 6 and a resist layer 7 on a transparent substrate 5 and further coating an electron beam sensitive material 8.;COPYRIGHT: (C)2015,JPO&INPIT
机译:要解决的问题:提供一种用于计算电子散射距离的测试件,该测试件用于计算反向散射电子束的分布状态,该反向散射电子束会在电子束曝光系统中产生雾化效果,并入射到绘图对象的表面。解决方案:解决方案:用于计算电子散射距离的测试件1用于计算入射到电子束曝光室内的绘图对象表面的反向散射电子束的分布状态系统。通过在透明基板5上形成遮光层6和抗蚀剂层7并进一步涂布电子束敏感材料8而获得用于计算电子散射距离的测试件1。版权所有:(C)2015,JPO&INPIT

著录项

  • 公开/公告号JP2015126004A

    专利类型

  • 公开/公告日2015-07-06

    原文格式PDF

  • 申请/专利权人 TOPPAN PRINTING CO LTD;

    申请/专利号JP20130267260

  • 发明设计人 GORAI RYOHEI;

    申请日2013-12-25

  • 分类号H01L21/027;G01N23/225;

  • 国家 JP

  • 入库时间 2022-08-21 15:32:21

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