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MINERAL ANALYZING APPARATUS, AND MINERAL ANALYZING METHOD

机译:矿物分析仪器和矿物分析方法

摘要

PROBLEM TO BE SOLVED: To provide a mineral analyzing apparatus and a mineral analyzing method that can accurately analyze the proportions of minerals contained in an ore.;SOLUTION: A mineral analyzing apparatus comprises a scanning electron microscope 10 including an energy dispersion type X-ray analyzer 11 and an analyzer unit 20. The analyzer unit 20 specifies mineral regions of mineral particles in a BSE (backscattered electron) image of polished ore pieces, identifies types of minerals on the basis of an EDS (energy dispersive X-ray spectrometry) spectrum of the mineral particles, removes, from the mineral regions, parts whose BSE brightness counts are not above a correction threshold, and figures out ratios of mineral species in the ore from square measures of the mineral regions and the mineral species. It is thereby made possible to exclude, from the mineral regions, the mineral parts embedded under the measurement surface and take into consideration only the measurement surface exposed on the measurement surface. As a result, the square measures of the mineral regions can be accurately figured out, and the proportions of mineral species contained in the ore can be accurately analyzed.;COPYRIGHT: (C)2015,JPO&INPIT
机译:解决的问题:提供一种矿物分析设备和一种矿物分析方法,其可以准确地分析矿石中所含矿物的比例。解决方案:一种矿物分析设备包括具有能量分散型X射线的扫描电子显微镜10分析器11和分析器单元20。分析器单元20在抛光的矿石块的BSE(背向散射电子)图像中指定矿物颗粒的矿物区域,基于EDS(能量色散X射线光谱)光谱来识别矿物的类型。从矿物区域中去除BSE亮度计数不超过校正阈值的部分,并从矿物区域和矿物种类的平方量中得出矿石中矿物种类的比率。因此,可以从矿物质区域中排除埋在测量表面下方的矿物质部分,并且仅考虑暴露在测量表面上的测量表面。结果,可以准确地算出矿产区域的平方尺寸,并且可以准确地分析矿石中所含矿物质的比例。;版权所有:(C)2015,日本特许厅&INPIT

著录项

  • 公开/公告号JP2015040724A

    专利类型

  • 公开/公告日2015-03-02

    原文格式PDF

  • 申请/专利权人 SUMITOMO METAL MINING CO LTD;

    申请/专利号JP20130170877

  • 发明设计人 AOKI YUJI;NAKAMURA KOJI;

    申请日2013-08-21

  • 分类号G01N23/225;G01N33/24;

  • 国家 JP

  • 入库时间 2022-08-21 15:32:04

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