Method and apparatus for single particle localization using wavelet analysis

摘要

Accurate localization of isolated particles is important in single particle based super-resolution microscopy. This allows imaging of biological samples with nanometer scale resolution using a simple fluorescence microscopy setup. It should be noted that conventional techniques for locating a single particle require up to one million times of localization to form an image and can take from several minutes to several hours of computation time. In contrast, this particle localization technique uses wavelet-based image decomposition and image segmentation to achieve nanometer-scale resolution in two dimensions within seconds to minutes. This two-dimensional localization can be scaled with localization in the third dimension based on its adaptability to the point spread function (PSF) of the imaging system, which can be asymmetric along the optical axis. . For an astigmatism imaging system, the PSF is elliptical and its decentration and orientation varies along the optical axis.