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scale error calculating device, scale error correcting device, and a memory error calculation method

机译:标度误差计算装置,标度误差校正装置和存储器误差计算方法

摘要

PROBLEM TO BE SOLVED: To provide a graduation error calculating device capable of highly accurately calculating a graduation error while minimizing the number of detectors.;SOLUTION: A graduation error calculating device 4 is used for a graduation error calibration device 1 including a dial 2 supported by a rotating shaft 22, and four detectors 3 disposed on the dial 2. The graduation error calculating device 4 includes: a detection value combining means 41 that calculates a linear sum by multiplying each of the detection values detected by the four detectors 3 by a predetermined coefficient; and Fourier component identification means 42 that identifies a Fourier component of the graduation error on the basis of the Fourier component of the linear sum calculated by the detection value combining means 41.;COPYRIGHT: (C)2013,JPO&INPIT
机译:要解决的问题:提供一种能够在最小化检测器数量的同时高精度地计算出刻度误差的刻度误差计算装置。解决方案:刻度误差计算装置4用于包括支持的刻度盘2的刻度误差校准装置1。分度误差计算装置4包括:检测值组合装置41,其通过旋转轴22和设置在刻度盘2上的四个检测器3。检测值组合装置41通过将四个检测器3检测到的每个检测值乘以a来计算线性和。预定系数;傅立叶分量识别装置42,基于由检测值组合装置41计算出的线性和的傅立叶分量,识别出分度误差的傅立叶分量。COPYRIGHT:(C)2013,JPO&INPIT

著录项

  • 公开/公告号JP5798824B2

    专利类型

  • 公开/公告日2015-10-21

    原文格式PDF

  • 申请/专利权人 株式会社ミツトヨ;

    申请/专利号JP20110160609

  • 发明设计人 奈良 正之;

    申请日2011-07-22

  • 分类号G01D5/244;

  • 国家 JP

  • 入库时间 2022-08-21 15:31:27

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