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Surface inspection equipment, surface inspection method and surface inspection program.

机译:表面检查设备,表面检查方法和表面检查程序。

摘要

PROBLEM TO BE SOLVED: To provide a surface inspection apparatus, a surface inspection program, and a method of inspecting a surface for inspecting surface defects such as a flaw, paint peel-off, and recesses on a surface precisely and speedily at low cost by simple structure even for a measurement target having strong surface reflection caused by, for example, the execution of the gloss coating of a body of an automobile and its components.;SOLUTION: A measurement space 1 including a curved wall 1b is constituted, the light source light of lighting systems 2-1, 2-2, 2-3 is attenuated and applied to a measurement target A within the measurement space 1, entire illumination images of the illuminated measurement target A are photographed, pattern light is projected to the curved wall 1b for reflection by a pattern light projection device 3 so that the pattern light does not directly hit the measurement target A, and a camera device 4 captures a reflection pattern image of the measurement target A to which the reflection pattern light is projected.;COPYRIGHT: (C)2011,JPO&INPIT
机译:解决的问题:提供一种表面检查装置,表面检查程序以及一种用于检查表面的方法,以低成本快速,准确地检查表面缺陷,例如缺陷,油漆剥落和表面上的凹陷。即使对于由于例如汽车车身及其部件的光泽涂层的执行而引起的具有强表面反射性的测量目标,也可以采用简单的结构。解决方案:构成包括弯曲壁1b的测量空间1,光线照明系统2-1、2-2、2-3的光源被衰减并施加到测量空间1内的测量目标A,拍摄照明的测量目标A的整个照明图像,将图案光投射到弯曲的壁1b被图案光投射装置3反射,以使图案光不直接照射到测量目标A,并且照相机装置4捕获测量的反射图案图像。投射有反射图案光的目标A。版权所有:(C)2011,日本特许厅&INPIT

著录项

  • 公开/公告号JP5728699B2

    专利类型

  • 公开/公告日2015-06-03

    原文格式PDF

  • 申请/专利权人 学校法人福岡工業大学;

    申请/专利号JP20100044706

  • 发明设计人 大橋 岳彦;盧 存偉;

    申请日2010-03-01

  • 分类号G01N21/88;G01B11/24;G01B11/30;

  • 国家 JP

  • 入库时间 2022-08-21 15:29:19

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