sky level measurement method and apparatus of the solid

摘要

while is sequentially changed in a range kinetic energy of 0-5 eV (accelerating energy) of the electron beam, to obtain a spectrum by measuring the intensity of near-ultraviolet light and visible light of 180-700 nm emitted from a solid sample of the organic semiconductor or the like which is illuminated it therebetween. It detects the mountain from this spectrum, and its energy and sky level energy of the sample. In particular, the energy of the rising portion of the first mountain represents an electron affinity energy (electron affinity) of the sample. Because the energy of the electron beam to be irradiated on the sample is 5 eV or less, there is little damage be an organic semiconductor sample.