首页> 外国专利> Proximity exposure apparatus and proximity exposure method .

Proximity exposure apparatus and proximity exposure method .

机译:近程曝光装置和近程曝光方法。

摘要

PROBLEM TO BE SOLVED: To provide a proximity exposing device and a proximity exposure method capable of averaging a gap between a mask and a workpiece by comparatively simple calculation and improving exposure accuracy.;SOLUTION: By a gap sensor 17, a gap between the mask M and the workpiece W is measured in each of four measurement points A, B, C and D. A Z-tilt adjustment mechanism 43 is driven so that, out of the coordinates of four median points K, L, M and N of respective sides of a quadrangle ABCD defined by the four measurement points A, B, C, and D, respective gaps in the coordinates of three median points K, L and M are equalized.;COPYRIGHT: (C)2011,JPO&INPIT
机译:解决的问题:提供一种能够通过比较简单的计算来平均掩模和工件之间的间隙并提高曝光精度的接近曝光装置和接近曝光方法;解决方案:通过间隙传感器17,掩模之间的间隙在四个测量点A,B,C和D中的每个测量M和工件W。驱动Z-倾斜调节机构43,以便从各自的四个中点K,L,M和N的坐标中由四个测量点A,B,C和D定义的四边形ABCD的两侧,三个中点K,L和M的坐标中的相应间隙均等。;版权所有:(C)2011,JPO&INPIT

著录项

  • 公开/公告号JP5674197B2

    专利类型

  • 公开/公告日2015-02-25

    原文格式PDF

  • 申请/专利权人 NSKテクノロジー株式会社;

    申请/专利号JP20110002986

  • 发明设计人 佐野 健;長谷川 一也;

    申请日2011-01-11

  • 分类号G03F7/20;H01L21/027;H01L21/68;

  • 国家 JP

  • 入库时间 2022-08-21 15:29:04

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