test pattern production equipment, fault detection system, test pattern production method, program and recording medium

摘要

while achieving the characteristics maintenance of the original test pattern to produce a new test pattern the possibility to, I will provide a test pattern production apparatus and the like. A test pattern producing unit for producing a test pattern to be input to the test circuit of the scan test, the first bit of a given, referring to the second bit and the logic value of the third bit, the second bit logic By maintaining or reversing the value comprises a logic value generation means for generating a new logic value, either the logic value of the first bit are those included in the initial test pattern is a given test pattern, or, are those having a new test pattern to produce a test pattern production device based on the initial test pattern, the logical value of the second bit are those included in the initial test pattern, the logical value of the third bit, the initial test or are included in the pattern, or have a new test pattern, test pattern production equipment.