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Test pattern production equipment, fault detection system, test pattern production method, program and recording medium
Test pattern production equipment, fault detection system, test pattern production method, program and recording medium
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机译:测试图制作设备,故障检测系统,测试图制作方法,程序和记录介质
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摘要
A test pattern generation device for generating a new test pattern keeping the feature of original test patterns. The test pattern generation device includes a logic value generation unit for generating a new logic value by referring given logic values of a first bit, a second bit and a third bit and by keeping or reversing a logic value of the second bit, wherein a logic value of the first bit is the same with a logic value of a given initial test pattern or a new test pattern generated by the test pattern generation device based on the initial test pattern, wherein a logic value of the second bit is the same with a logic value of the initial test pattern, and wherein a logic value of the third bit is the same with a logic value of the initial test pattern or the new test pattern.
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