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Quantum efficiency measurement method and quantum efficiency measurement device

机译:量子效率测量方法及量子效率测量装置

摘要

A quantum efficiency measurement method includes the steps of: disposing a sample at a predetermined position in an integrator having an integrating space; applying excitation light to the sample and measuring a spectrum in the integrating space as a first spectrum through a second window; configuring an excitation light incident portion so that excitation light after having passed through the sample is not reflected in the integrating space; applying the excitation light to the sample and measuring a spectrum in the integrating space as a second spectrum through the second window; and calculating a quantum efficiency of the sample based on a component constituting a part of the first spectrum and corresponding to a wavelength range of the excitation light, and a component constituting a part of the second spectrum and corresponding to a wavelength range of light generated by the sample from the received excitation light.
机译:一种量子效率测量方法,包括以下步骤:将样品放置在具有积分空间的积分器中的预定位置处;向样品施加激发光,并通过第二窗口测量积分空间中的光谱作为第一光谱;构造激发光入射部分,以使得已经穿过样品的激发光在积分空间中不被反射;将激发光施加到样品上,并通过第二窗口测量积分空间中的光谱作为第二光谱;并基于构成第一光谱的一部分并与激发光的波长范围相对应的成分,以及构成第二光谱的一部分并与由光产生的光的波长范围相对应的成分,计算样品的量子效率。来自接收到的激发光的样品。

著录项

  • 公开/公告号JP5640257B2

    专利类型

  • 公开/公告日2014-12-17

    原文格式PDF

  • 申请/专利权人 大塚電子株式会社;

    申请/专利号JP20100061804

  • 发明设计人 大澤 祥宏;大久保 和明;

    申请日2010-03-18

  • 分类号G01J3/443;G01N21/64;

  • 国家 JP

  • 入库时间 2022-08-21 15:28:27

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