首页> 外国专利> REFRACTIVE-INDEX DISTRIBUTION MEASURING METHOD, REFRACTIVE-INDEX DISTRIBUTION MEASURING APPARATUS, METHOD OF MANUFACTURING OPTICAL ELEMENT, AND NON-TRANSITORY COMPUTER-READABLE STORAGE MEDIUM

REFRACTIVE-INDEX DISTRIBUTION MEASURING METHOD, REFRACTIVE-INDEX DISTRIBUTION MEASURING APPARATUS, METHOD OF MANUFACTURING OPTICAL ELEMENT, AND NON-TRANSITORY COMPUTER-READABLE STORAGE MEDIUM

机译:折射率分布测量方法,折射率分布测量设备,制造光学元件的方法以及非暂态计算机可读存储介质

摘要

A refractive-index distribution measuring method includes the steps of measuring a transmitted wavefront of an object, determining a first refractive index distribution of the object based on a measurement result of the transmitted wavefront, determining a third refractive index distribution in a transmission direction of light of the transmitted wavefront based on information related to a second refractive index distribution of the object, and calculating a three-dimensional refractive index distribution of the object based on the first refractive index distribution and the third refractive index distribution.
机译:折射率分布测量方法包括以下步骤:测量物体的透射波阵面,基于透射波阵面的测量结果确定物体的第一折射率分布,确定沿光的透射方向的第三折射率分布基于与物体的第二折射率分布有关的信息来确定透射波前的波前,并基于第一折射率分布和第三折射率分布来计算物体的三维折射率分布。

著录项

  • 公开/公告号US2015260605A1

    专利类型

  • 公开/公告日2015-09-17

    原文格式PDF

  • 申请/专利权人 CANON KABUSHIKI KAISHA;

    申请/专利号US201514657587

  • 发明设计人 SEIMA KATO;

    申请日2015-03-13

  • 分类号G01M11/02;

  • 国家 US

  • 入库时间 2022-08-21 15:27:06

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