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METHODS OF SELECTIVELY GROWING SOURCE/DRAIN REGIONS OF FIN FIELD EFFECT TRANSISTOR AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE INCLUDING A FIN FIELD EFFECT TRANSISTOR
METHODS OF SELECTIVELY GROWING SOURCE/DRAIN REGIONS OF FIN FIELD EFFECT TRANSISTOR AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE INCLUDING A FIN FIELD EFFECT TRANSISTOR
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机译:选择性生长鳍式场效应晶体管的源/漏区的方法和制造包括鳍式场效应晶体管的半导体器件的方法
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摘要
The inventive concepts provide methods of manufacturing a semiconductor device. The method includes patterning a substrate to form an active pattern, forming a gate pattern intersecting the active pattern, forming a gate spacer on a sidewall of the gate pattern, forming a growth-inhibiting layer covering an upper region of the gate pattern, and forming source/drain electrodes at opposite first and second sides of the gate pattern.
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