CENTIMETER-SCALE HIGH RESOLUTION METROLOGY OF ENTIRE CVD GROWN GRAPHENE SHEETS

摘要

A method for quick and easy identification of layer thickness and uniformity of entire large-area graphene samples on arbitrary substrates utilizing fluorescence quenching microscopy in which a polymer mixed with fluorescent dye is applied onto the graphene, then viewing the sample under a fluorescence microscope. A large-scale, high-resolution montage image of the sample is obtained for histogram-based segmentation based on contrast relative to the substrates.