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Centimeter-scale high resolution metrology of entire CVD grown graphene sheets
Centimeter-scale high resolution metrology of entire CVD grown graphene sheets
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机译:整个CVD生长的石墨烯片的厘米级高分辨率计量
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摘要
A method for quick and easy identification of layer thickness and uniformity of entire large-area graphene samples on arbitrary substrates utilizing fluorescence quenching microscopy in which a polymer mixed with fluorescent dye is applied onto the graphene, then viewing the sample under a fluorescence microscope. A large-scale, high-resolution montage image of the sample is obtained for histogram-based segmentation based on contrast relative to the substrates.
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