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Method and apparatus for surface mapping using in-plane grazing incidence diffraction
Method and apparatus for surface mapping using in-plane grazing incidence diffraction
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机译:使用面内掠入射衍射进行表面映射的方法和设备
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摘要
An apparatus for examining the surface of a crystalline sample uses in-plane grazing incidence diffraction with a position-sensitive detector. The x-ray source illuminates an extended region of the sample and, for crystal sections having the appropriate lattice orientation, an elongated diffraction signal is produced. The relative position of the sample and the x-ray beam may then be changed to illuminate different regions of the sample so that the diffraction signal corresponds to these other regions. By scanning across the entire sample, a spatial profile of the sample surface may be generated. The system may be used to locate crystal boundaries, defects, or the presence of attenuating materials on the sample surface.
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