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Systems and methods for controlling and measuring modes possessing even and odd symmetry in a photonic crystal waveguide

机译:用于控制和测量在光子晶体波导中具有偶数和奇数对称性的模式的系统和方法

摘要

Systems and methods for controlling and measuring modes possessing even and odd symmetry in a slow-light photonic crystal waveguide. An example device comprises a photonic crystal waveguide having modes possessing even and odd symmetry, and a Mach-Zehnder coupler comprising two waveguide branches one of which has a phase adjuster. Another example device, which can be used as an optical isolator, comprises two Mach-Zehnder couplers, and a photonic crystal waveguide comprising an electro-optic modulator therein. A method of measuring a group index of a mode with odd symmetry comprises: coupling light into a photonic crystal waveguide through a Mach-Zehnder coupler with a mixed even/odd symmetry, measuring insertion loss of the combined light signal after passing through the photonic crystal waveguide, determining the spacings of adjacent peaks or valleys from the insertion loss versus wavelength plot, and using the spacings to determine the group index of the odd symmetry mode.
机译:用于控制和测量在慢光光子晶体波导中具有偶数和奇数对称性的模式的系统和方法。示例设备包括具有具有偶数和奇数对称性的模的光子晶体波导,以及包括两个波导分支的马赫曾德尔耦合器,其中两个波导分支具有相位调节器。可以用作光隔离器的另一示例装置,包括两个马赫曾德尔耦合器,以及在其中包括电光调制器的光子晶体波导。一种测量具有奇对称性的模的群折射率的方法,该方法包括:通过具有混合偶/奇对称性的Mach-Zehnder耦合器将光耦合到光子晶体波导中,测量穿过光子晶体后的组合光信号的插入损耗。波导,根据插入损耗与波长图确定相邻峰或谷的间距,并使用该间距确定奇对称模式的组索引。

著录项

  • 公开/公告号US9086583B1

    专利类型

  • 公开/公告日2015-07-21

    原文格式PDF

  • 申请/专利权人 WEI JIANG;

    申请/专利号US201313945291

  • 发明设计人 WEI JIANG;

    申请日2013-07-18

  • 分类号G02F1/035;G02F1/01;G01N21/17;

  • 国家 US

  • 入库时间 2022-08-21 15:20:07

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