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Cell test method and liquid crystal display panel for a tri-gate type pixel structure

机译:用于三栅型像素结构的单元测试方法和液晶显示面板

摘要

A cell test method for a liquid crystal display panel includes the following steps. A waveform sequence to shorting bars is provided, wherein the waveform sequence includes that the first gate line sends a voltage of “turn on” signal and the second and third gate lines send a voltage of “turn off” signal at the first and second time periods; and the waveform sequence further comprises that the first and second data lines respectively send first and second voltages at the first and second time periods, the first threshold voltage is higher than the first voltage, the first voltage is higher than the common voltage, the common voltage is higher than the second voltage, and the second voltage is higher than the second threshold voltage, whereby pixels defined by the first gate line and the first and second data lines is turn on.
机译:液晶显示面板的单元测试方法包括以下步骤。提供了到短路条的波形序列,其中该波形序列包括:第一栅极线在第一时间和第二时间发送“接通”信号的电压,第二栅极线和第三栅极线在第一和第二时刻发送“断开”信号的电压。期间;波形序列还包括:第一数据线和第二数据线分别在第一时间段和第二时间段发送第一电压和第二电压,第一阈值电压高于第一电压,第一电压高于公共电压,电压高于第二电压,并且第二电压高于第二阈值电压,由此由第一栅极线以及第一和第二数据线限定的像素导通。

著录项

  • 公开/公告号US9087475B2

    专利类型

  • 公开/公告日2015-07-21

    原文格式PDF

  • 申请/专利权人 TAI-FU LU;

    申请/专利号US201213612430

  • 发明设计人 TAI-FU LU;

    申请日2012-09-12

  • 分类号G01R31/26;G09G3/00;

  • 国家 US

  • 入库时间 2022-08-21 15:20:00

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