首页> 外国专利> Endurance and retention flash controller with programmable binary-levels-per-cell bits identifying pages or blocks as having triple, multi, or single-level flash-memory cells

Endurance and retention flash controller with programmable binary-levels-per-cell bits identifying pages or blocks as having triple, multi, or single-level flash-memory cells

机译:具有可编程的每单元二进制级别位的耐久性和保留闪存控制器,可将页面或块识别为具有三级,多层或单级闪存单元

摘要

An retention flash controller reads assigned-level bits from a bad block/erase count table or from a page status table that indicate when flash memory cells operate as Triple-Level-Cell (TLC), Multi-Level-Cell (MLC), or Single-Level-Cell (SLC). Pages that fail as TLC or MLC are downgraded for use as SLC pages by changing the assigned-level bits. The level bits adjust truth tables used by translation logic that receives inputs from voltage comparators reading a bit line. The range of voltages for each logic level may be adjusted by the truth tables or by programmable registers. The programming voltage or programming pulses may be adjusted to increase endurance and the number of permitted program-erase cycles while reducing retention times before a refresh is needed of the flash cells. Mixed configurations of flash memory have MLC blocks and MLC as SLC blocks, or other combinations.
机译:保留闪存控制器从错误的块/擦除计数表或页面状态表中读取分配的位,这些状态位指示闪存单元何时以三级单元(TLC),多级单元(MLC)或单层单元(SLC)。通过更改分配的级别位,无法将作为TLC或MLC失败的页面降级以用作SLC页面。电平位调整转换逻辑所使用的真值表,转换逻辑从电压比较器接收读取位线的输入。每个逻辑电平的电压范围可以通过真值表或可编程寄存器进行调整。可以调整编程电压或编程脉冲以增加耐久性和允许的编程擦除周期的数量,同时减少在需要刷新单元之前的保留时间。闪存的混合配置具有MLC块和MLC作为SLC块,或其他组合。

著录项

  • 公开/公告号US9123422B2

    专利类型

  • 公开/公告日2015-09-01

    原文格式PDF

  • 申请/专利权人 SUPER TALENT TECHNOLOGY CORP.;

    申请/专利号US201313788989

  • 申请日2013-03-07

  • 分类号G06F12/00;G06F13/00;G06F13/28;G11C16/10;G06F12/02;G11C13/00;G11C29/00;

  • 国家 US

  • 入库时间 2022-08-21 15:19:29

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