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Systems and methods for high aspect ratio flip-chip interconnects

机译:高长宽比倒装芯片互连的系统和方法

摘要

Interconnect and/or reflow methods of the present disclosure achieve high aspect ratio interconnects, for example interconnects having an aspect ratio as high as 4, in addition to wider interconnect height tolerances among interconnects (for example, interconnects having a height variability of up to about 30%) while still achieving reliable electrical connections. Moreover, flip-chip interconnects configured in accordance with principles of the present disclosure can provide improved z-axis spacing between die-to-die and/or die-to-substrate flip chip stacks, for example z-axis spacing as large as 600 μm. In this manner, additional spacing can be achieved for MEMS devices and/or similar components that are extendable and/or deformable out of the die plane.
机译:本公开内容的互连和/或回流方法实现了高纵横比互连,例如具有高至4的纵横比的互连,以及互连之间更宽的互连高度公差(例如,高度可变性高达约4.5%的互连)。 30%),同时仍能实现可靠的电气连接。此外,根据本公开的原理配置的倒装芯片互连可以在管芯到管芯和/或管芯到基板的倒装芯片堆叠之间提供改善的z轴间距,例如,最大为600的z轴间距。微米以这种方式,可以为可在管芯平面外延伸和/或变形的MEMS器件和/或类似部件实现额外的间隔。

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