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Sparse sampling and reconstruction for electron and scanning probe microscope imaging
Sparse sampling and reconstruction for electron and scanning probe microscope imaging
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机译:电子和扫描探针显微镜成像的稀疏采样和重建
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摘要
Systems and methods for conducting electron or scanning probe microscopy are provided herein. In a general embodiment, the systems and methods for conducting electron or scanning probe microscopy with an undersampled data set include: driving an electron beam or probe to scan across a sample and visit a subset of pixel locations of the sample that are randomly or pseudo-randomly designated; determining actual pixel locations on the sample that are visited by the electron beam or probe; and processing data collected by detectors from the visits of the electron beam or probe at the actual pixel locations and recovering a reconstructed image of the sample.
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