首页> 外国专利> Semiconductor devices including a gate structure between active regions, and methods of forming semiconductor devices including a gate structure between active regions

Semiconductor devices including a gate structure between active regions, and methods of forming semiconductor devices including a gate structure between active regions

机译:包括有源区之间的栅极结构的半导体器件以及形成包括有源区之间的栅极结构的半导体器件的方法

摘要

Semiconductor devices are provided. The semiconductor devices may include an isolation pattern and first, second, and third active regions of a substrate. The first active region may be spaced apart from the second active region by a first width of the isolation pattern in a direction. A gate structure may be between the first and second active regions and may include a second width wider than the first width of the isolation pattern in the direction. Related methods of forming semiconductor devices are also provided.
机译:提供了半导体器件。半导体器件可以包括隔离图案以及衬底的第一,第二和第三有源区。第一有源区域可以在方向上与第二有源区域间隔开隔离图案的第一宽度。栅极结构可以在第一有源区域和第二有源区域之间,并且可以包括在方向上比隔离图案的第一宽度宽的第二宽度。还提供了形成半导体器件的相关方法。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号