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Calculation of analog memory cell readout parameters using code words stored over multiple memory dies
Calculation of analog memory cell readout parameters using code words stored over multiple memory dies
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机译:使用存储在多个存储管芯上的代码字来计算模拟存储单元的读出参数
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摘要
A method includes, in a memory that includes two or more memory units, storing a code word of an Error Correction Code (ECC) that is representable by a plurality of check equations, such that a first part of the code word is stored in a first memory unit and a second part of the code word is stored in a second memory unit. A subset of the check equations, which operate only on code word bits belonging to the first part stored in the first memory unit, is identified. The first part of the code word is retrieved from the first memory unit, and a count of the check equations in the identified subset that are not satisfied by the retrieved first part of the code word is evaluated. One or more readout parameters, for readout from the first memory unit, are set depending on the evaluated count.
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