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Synchronizer and buffers delaying strobe to individual parallel scan paths
Synchronizer and buffers delaying strobe to individual parallel scan paths
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机译:同步器和缓冲器将选通延迟到单独的并行扫描路径
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摘要
Functional circuits and cores of circuits are tested on integrated circuits using scan paths. Using parallel scan distributor and collector circuits for these scan paths improves test access of circuits and cores embedded within ICs and reduces the IC's power consumption during scan testing. A controller for the distributor and collector circuits includes a test control register, a test control state machine and a multiplexer. These test circuits can be connected in a hierarchy or in parallel. A conventional test access port or TAP can be modified to work with the disclosed test circuits.
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