首页> 外国专利> The process och measurement device for measuring the ytans at a distance, the thickness of the optical properties of the Science hos that objekt

The process och measurement device for measuring the ytans at a distance, the thickness of the optical properties of the Science hos that objekt

机译:用于远距离测量ytan的过程测量设备,该光学特性的厚度不受阻碍

摘要

In the measuring device and measuring method, confocal measuring principle is utilized. A certain component of an optical measurement signal is, from the point of view of both illumination and imaging, in focus only at one point on the virtual measuring surface. In the measuring device, the surface to be measured always hits a common focus point of the illumination and imaging, whereby a reflection is generated. The reflected optical signal is directed to a detector belonging to the imaging unit, where one picture element of the detector corresponds to a certain focus point, respectively. The optical efficiency received by each picture element is indicated. The light reflecting from the intersection of the virtual measuring surface and the surface of the object produces an intensity maximum for the detector. This maximum point is indicated and converted in the imaging unit (13) into the height of the surface of the object.
机译:在测量装置和测量方法中,利用了共焦测量原理。从照明和成像的角度来看,光学测量信号的特定分量仅聚焦在虚拟测量表面上的一个点上。在测量装置中,待测量的表面总是碰到照明和成像的共同焦点,从而产生反射。反射的光信号被引导到属于成像单元的检测器,其中该检测器的一个像素分别对应于某个焦点。指示每个像素接收的光效率。从虚拟测量表面和物体表面的相交处反射的光为检测器产生最大强度。指示该最大点,并在成像单元(13)中将其转换为对象表面的高度。

著录项

  • 公开/公告号FI125408B

    专利类型

  • 公开/公告日2015-09-30

    原文格式PDF

  • 申请/专利权人 FOCALSPEC OY;

    申请/专利号FI20120005958

  • 发明设计人 KERÄNEN HEIMO;

    申请日2012-09-17

  • 分类号G01B11/06;G01B11/14;G01N21/47;G01N21/55;G01N21/57;G01S17/46;

  • 国家 FI

  • 入库时间 2022-08-21 15:15:27

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