首页> 外国专利> 3-d imaging system and method using partial-coherence speckle interference tomography

3-d imaging system and method using partial-coherence speckle interference tomography

机译:使用部分相干散斑干涉层析成像的3-d成像系统和方法

摘要

A system (100) for generating an image of contoured surface (50) includes a light source (120) that is configured to project an electromagnetic radiation beam (126) onto the contoured surface, wherein the projected beam generates first radiation (128) reflected from a first portion of the contoured surface to form a speckle pattern, and second radiation (128) reflected from a second portion of the contoured surface which is substantially uniform in intensity. The reflected first and second reflected radiation is received by an optical detector (135), and may be processed. The processing is configured to (1) generate a plurality of images from the first and second reflected radiation, with each image being generated using different coherence length electromagnetic radiation from the light source, and (2) generate a 3-D image (170) of the contoured surface from the plurality of images. Methods for generating a 3-D image of a contoured surface are also disclosed.
机译:用于产生轮廓表面(50)的图像的系统(100)包括光源(120),该光源被配置为将电磁辐射束(126)投射到轮廓表面上,其中投射束产生反射的第一辐射(128)。从轮廓表面的第一部分形成斑点图案,以及从轮廓表面的第二部分反射的第二辐射(128)强度基本均匀。反射的第一和第二反射辐射被光学检测器(135)接收,并且可以被处理。该处理被配置为(1)从第一和第二反射辐射生成多个图像,每个图像是使用来自光源的不同相干长度电磁辐射生成的,并且(2)生成3-D图像(170)来自多个图像的轮廓表面的角度。还公开了用于产生轮廓表面的3D图像的方法。

著录项

  • 公开/公告号IL210874A

    专利类型

  • 公开/公告日2015-09-24

    原文格式PDF

  • 申请/专利权人 RAYTHEON COMPANY;

    申请/专利号IL20110210874

  • 发明设计人

    申请日2011-01-25

  • 分类号G01Bnull/null;G06Knull/null;H04Nnull/null;

  • 国家 IL

  • 入库时间 2022-08-21 15:15:19

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号