INSTRUMENT AND METHOD FOR ELECTRICALLY CHARACTERIZING CONDUCTING AND SEMICONDUCTING MATERIALS IN VOLUMES WITH DIFFERENT POROSITY.

摘要

The present invention refers to an instrument and method for characterizing the resistive electric behavior of cylindrical-shaped components, figure1, of materials such as granulated nanomaterials, semiconductors and conductors susceptible to be compacted in different volumes of constant mass, for manufacturing cylindrical shaped components with resistivity according to the electric need required in a determined technological application from resistances, sensors and electrochemical or photo-electrochemical cells, etc.