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IDENTIFYING CRITICAL FEATURES IN ORDERED SCALE SPACE

机译:识别有序尺度空间中的关键特征

摘要

A system and method for identifying critical features in an ordered scalespace within amulti-dimensional feature space is described. Features are extracted from aplurality of datacollections. Each data collection is characterized by a collection of featuressemantically-relatedby a grammar. Each feature is normalized and frequencies of occurrence and co-occurrences forthe feature for each of the data collections is determined. The occurrencefrequencies and the co-occurrencefrequencies for each of the features are mapped into a set of patterns ofoccurrencefrequencies and a set of patterns of co-occurrence frequencies. The patternfor each datacollection is selected and distance (similarity) measures between eachoccurrence frequency inthe selected pattern is calculated. The occurrence frequencies are projectedonto a one-dimensionaldocument signal in order of relative decreasing similarity using thesimilaritymeasures. Wavelet and scaling coefficients are derived from the one-dimensional documentsignal using multiresolution analysis.
机译:用于以有序比例尺识别关键特征的系统和方法内的空间描述了多维特征空间。特征是从多个数据集合。每个数据收集都有一组特征语义相关通过语法。每个功能都已标准化,发生频率和共发生的次数确定每个数据收集的特征。发生频率和同现每个特征的频率被映射为一组模式发生频率和一组同时出现的频率模式。图案对于每个数据选择集合,每个集合之间的距离(相似性)度量发生频率计算出所选花样。预计发生频率在一维上文档信号使用相似措施。小波和缩放系数是从一个尺寸文件多分辨率分析获得信号。

著录项

  • 公开/公告号CA2509580C

    专利类型

  • 公开/公告日2014-12-09

    原文格式PDF

  • 申请/专利权人 ATTENEX CORPORATION;

    申请/专利号CA20032509580

  • 发明设计人 KNIGHT WILLIAM;

    申请日2003-12-11

  • 分类号G06F17/30;G06F17/27;

  • 国家 CA

  • 入库时间 2022-08-21 15:11:48

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