首页> 外国专利> LASER PROCESSING DEVICE, LASER PROCESSING TEMPERATUTRE MEASURING DEVICE, LASER PROCESSING METHOD AND LASER PROCESSING TEMPERATURE MEASURING METHOD

LASER PROCESSING DEVICE, LASER PROCESSING TEMPERATUTRE MEASURING DEVICE, LASER PROCESSING METHOD AND LASER PROCESSING TEMPERATURE MEASURING METHOD

机译:激光加工设备,激光加工温度测量设备,激光加工方法和激光加工温度测量方法

摘要

The object is to provide a laser processing apparatus, a laser processing temperature measuring apparatus, a laser processing method, and a laser processing temperature measuring method which can highly accurately detect the processing temperature when carrying out processing such as welding with laser light. A laser processing apparatus 1A for processing members DR, UR to be processed by irradiating the members with laser light LB comprises a laser (semiconductor laser unit 20A) for generating the laser light LB; optical means for converging the laser light LB generated by the laser onto processing areas DA, UA; and a filter 30, disposed between the members DR, UR to be processed and the optical means, for blocking a wavelength of fluorescence generated by the optical means upon pumping with the laser light LB; wherein light having the wavelength blocked by the filter 30 is used for measuring a temperature of the processing areas DA, UA. IMAGE
机译:本发明的目的是提供一种激光加工装置,激光加工温度测量装置,激光加工方法以及激光加工温度测量方法,其能够在进行激光焊接等加工时高精度地检测加工温度。用于通过用激光LB照射部件DR,UR来加工部件的激光加工设备1A包括用于产生激光LB的激光器(半导体激光器单元20A);用于将由激光产生的激光LB会聚到处理区域DA,UA上的光学装置。滤光器30,设置在要处理的部件DR,UR和光学装置之间,用于在泵浦激光LB时阻挡由光学装置产生的荧光的波长;其中具有被滤光器30阻挡的波长的光用于测量处理区域DA,UA的温度。 <图像>

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