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SPIN DETECTOR, CHARGED PARTICLE BEAM DEVICE AND PHOTOEMISSION SPECTROSCOPIC DEVICE

机译:自旋探测器,带电粒子束设备和光变分光镜设备

摘要

This spin detector is equipped with a plurality of VLEED detectors (104) disposed in the vicinity of an optical axis of electrons (101) to be measured. The VLEED detectors each have a voltage applied thereto which becomes sequentially lower in the direction of travel of the electrons to be measured. As the electrons to be measured pass through the rows of VLEED detectors, the energy thereof decreases, causing the electrons to be taken into the VLEED detectors sequentially. This allows a VLEED detector, a spin detector with a narrow energy acceptance, to be used for highly efficient detection of a spin polarization possessed by secondary electrons with an energy dispersion of, for instance, on the order of 0 to 20 V.
机译:该自旋检测器配备有多个VLEED检测器(104),其布置在要测量的电子(101)的光轴附近。每个VLEED检测器都施加有电压,该电压在要测量的电子的行进方向上依次降低。随着要测量的电子通过VLEED检测器的行,其能量减小,从而使电子顺序地被带入VLEED检测器。这允许将VLEED检测器,具有窄能量接受的自旋检测器用于高效检测二次电子所具有的自旋极化,该二次电子的能量分散度约为0至20V。

著录项

  • 公开/公告号WO2015029201A1

    专利类型

  • 公开/公告日2015-03-05

    原文格式PDF

  • 申请/专利权人 HITACHI LTD.;

    申请/专利号WO2013JP73243

  • 发明设计人 KOHASHI TERUO;

    申请日2013-08-30

  • 分类号H01J37/244;H01J37/28;

  • 国家 WO

  • 入库时间 2022-08-21 15:08:02

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