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METHOD AND DEVICE FOR ESTIMATING QUALITY FACTOR BASED ON ZERO OFFSET VERTICAL SEISMIC PROFILING DATA

机译:基于零偏移垂直地震剖面数据的质量因子估算方法和装置

摘要

A method and device for estimating a quality factor based on zero offset vertical seismic profiling data, the method comprising the following steps: determining a transmission coefficient between two adjacent vertical seismic profiling (VSP) paths based on an interval velocity of a seismic wave in the zero offset VSP data (101); determining the transmission coefficient as an indeterminate coefficient in an objective function of an exponential method, and estimating the quality factor according to the objective function of the exponential method (102). The method and device solves the technical problem in prior art of low stability and accuracy in estimating a quality factor due to the presence of an indeterminate coefficient in the process of estimating the quality factor using the exponential method, thus improving the stability and accuracy in estimating the quality factor.
机译:一种用于基于零偏移垂直地震剖面数据来估计品质因数的方法和装置,该方法包括以下步骤:基于地震波的间隔速度确定两个相邻的垂直地震剖面(VSP)路径之间的传输系数。零偏移VSP数据(101);在指数方法的目标函数中将透射系数确定为不确定的系数,并根据指数方法的目标函数估计品质因数(102)。本发明解决了现有技术中使用指数法估算品质因数时存在不确定系数导致的稳定性低,估算准确度高的技术问题,提高了估算的稳定性和准确性。品质因数。

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