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FIRST AND SECOND ORDER FOCUSING USING FIELD FREE REGIONS IN TIME-OF-FLIGHT
FIRST AND SECOND ORDER FOCUSING USING FIELD FREE REGIONS IN TIME-OF-FLIGHT
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机译:使用飞行时间中的自由场区域进行一阶和二阶聚焦
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摘要
In some embodiments, time-of-flight mass spectrometry instrument may include input orifice for receiving ion, first ion accelerator stage is for promoting ion along first path, at least one ion mirror, for receiving the ion of the acceleration and redirecting the ion along the second path for being different from first path, at least part of ion redirection is detected by least one described ion mirror, and at least the detector described in first accelerating stage is arranged in first and second free drift regions, wherein the secondary field-free region domain is arranged near detector. In some embodiments, the length in no electrical drift area can be selected, in order to provide first and the second order correction propagation time variation ion relative to its initial position.
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