A data processing unit (11) provided with a frequency analyzer (21) for performing vibration frequency analysis, a noise level calculator (23) for calculating the level of noise produced outside an X-ray tube, and a defect sign detector (25) for detecting a sign of an X-ray tube defect. The defect sign detector (25), upon being triggered by the noise level calculated by the noise level calculator (23) falling to or below a predetermined threshold value, performs a frequency analysis on the vibration produced inside the X-ray tube through the frequency analyzer (21), and detects a sign of a detect on the basis of the analysis result.
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