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Single-poly floating-gate transistor comprising an erase gate formed in the substrate

机译:单多晶硅浮栅晶体管,包括形成在衬底中的擦除栅

摘要

An erasable programmable single-poly nonvolatile memory includes a substrate structure; a first PMOS transistor comprising a select gate (34), a first source/drain region (31), and a second source/drain region (32), wherein the select gate is connected to a select gate voltage, and the first source/drain region is connected to a source line voltage; a second PMOS transistor comprising the second source/drain region (32), a third source/drain region (33), and a floating gate (36), wherein the third source/drain region is connected to a bit line voltage and the first, second and third source/drain regions are constructed in an N-well region (NW); and an erase gate region (35) adjacent to the floating gate (36), wherein the erase gate region comprises an n-type source/drain region (38) connected to an erase line voltage and a P-well region (PW); wherein the N-well region (NW) and the P-well region (PW) are formed in the substrate structure.
机译:一种可擦可编程单多晶硅非易失性存储器,包括衬底结构;第一PMOS晶体管,其包括选择栅(34),第一源/漏区(31)和第二源/漏区(32),其中选择栅连接到选择栅电压,并且第一源/漏漏极区连接到源极线电压;第二PMOS晶体管,其包括第二源极/漏极区域(32),第三源极/漏极区域(33)和浮置栅极(36),其中第三源极/漏极区域连接到位线电压,并且第一,第二和第三源/漏区构造在N阱区(NW)中;以及与浮置栅极(36)相邻的擦除栅极区域(35),其中该擦除栅极区域包括连接至擦除线电压的n型源极/漏极区域(38)和P阱区域(PW);其中在衬底结构中形成N阱区(NW)和P阱区(PW)。

著录项

  • 公开/公告号EP2811530A1

    专利类型

  • 公开/公告日2014-12-10

    原文格式PDF

  • 申请/专利权人 EMEMORY TECHNOLOGY INC.;

    申请/专利号EP20130170432

  • 发明设计人 CHEN WEI-REN;HSU TE-HSUN;LEE WEN-HAO;

    申请日2013-06-04

  • 分类号H01L29/788;G11C16/04;H01L27/115;

  • 国家 EP

  • 入库时间 2022-08-21 15:04:40

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