首页> 外国专利> SEQUENTIAL PRECURSOR DOSING IN ALD MULTI-STATION/BATCH REACTOR

SEQUENTIAL PRECURSOR DOSING IN ALD MULTI-STATION/BATCH REACTOR

机译:ALD多工位/分批反应器中的顺序先驱剂量

摘要

Disclosed herein are methods of depositing layers of material on multiple semiconductor substrates at multiple processing stations within one or more reaction chambers. The methods may include dosing a first substrate with film precursor at a first processing station and dosing a second substrate with film precursor at a second processing station with precursor flowing from a common source, wherein the timing of said dosing is staggered such that the first substrate is dosed during a first dosing phase during which the second substrate is not substantially dosed, and the second substrate is dosed during a second dosing phase during which the first substrate is not substantially dosed.Also disclosed herein are apparatuses having a plurality of processing stations contained within one or more reaction chambers and a controller with machine-readable instructions for staggering the dosing of first and second substrates at first and second processing stations.;COPYRIGHT KIPO 2015
机译:本文公开了在一个或多个反应室内的多个处理站处在多个半导体衬底上沉积材料层的方法。该方法可以包括在第一处理工位处给第一基板上的膜前驱物和在第二处理工位处给第二基板上的膜前驱物和从公共源流出的前驱物,其中所述给料的时间错开,使得第一基板在基本未分配第二衬底的第一加料阶段中进行配料,并且在基本未分配第一衬底的第二加料阶段中进行第二配料。本文还公开了具有多个处理站的设备在一个或多个反应室中,以及带有机器可读指令的控制器,用于在第一和第二处理站错开第一和第二基板的剂量。; COPYRIGHT KIPO 2015

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